Physical foundations and results of the study of absorption in thin films of germanium doped with silicon
Abstract
Physical foundations and results of the study of absorption in thin films of germanium doped with silicon
Incoming article date: 23.04.2022Theoretical relations are presented that serve to estimate the absorbing properties of thin optical films using functions that determine the envelopes of interference extrema in the transmission spectrum of a thin optical film on a plane-parallel transparent substrate, as well as the experimental results of estimating infrared losses in Ge films doped with Si.
Keywords: interference, absorption, optics, film, refractive index